Spanish National Research Council · University of Seville
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Funding for the research activities carried out at IMSE-CNM comes primarily from the participation in competitive tender processes. The research is then conducted out via agreements, projects and contracts with national and international public organizations and private companies and organizations.

Statistical approach to defect simulation in complex Analog and Mixed-Signal circuits: application to radiation-induced Single-Event Transients
PI: Gildas Léger
Type: Research project
Reference: RTI2018-098513-B-I00
Funding Body: Ministerio de Ciencia, Innovación y Universidades
Start date: 01/01/2019
End date: 31/12/2021
Funding: 75.141,00 €
Abstract: In salety-critical applications, detecting fabrication delects is of utmost importance, even if they do not impact significantly the performance. Defect-oriented test approaches are thus necessary, but their validation is cumbersome. Indeed, defect simulation is unavoidable but computationally demanding. For complex Analog and Mixed-Signal (AMS) circuits and systems, the number of defect candidates may be very large. If the evaluation of each defect candidate requires a complex transient simulation, exhaustive simulation is simply intractable. Sound statistical approaches to estimate defect coverage have been proposed, but one of the main shortcomings of these approaches is that of experimental validation. On one hand, it is almost impossible to get access to delect statistics of commercíal parts since this data is a very sensitive in terms of company image. On the other hand, it is al so impossible to manulacture (and test) a sulficient amount of circuits to get reliable statístics in an academic environmenl. Europractice integration services usually give access to around 50 parts, very far of the production level necessary to estimate a defectivity rate in the arder of tens 01 ppm.
In order to tackle this validation issue, this project propases to adapt the framework of statistical assessment of defect coverage to the study of radiation-induced Single-Event Transient (SET) sensitivity in complex Analog and Mixed-Signal circuits.

Indirect test solutions for analog, mixed-signal, and RF integrated systems
PI: Gildas Léger
Type: Proyectos bilaterales
Reference: PIC2016FR5
Funding Body: CSIC
Start date: 01/01/2017
End date: 31/12/2019
Funding: 10.000,00 €
Abstract: The combination of indirect test and built-In Self-Test (BIST) is a promising solution to mitigate the increasing cost of testing complex mixed-signal integrated systems. Indirect test replaces complex specification measurements by simpler signatures, and then uses moden data analysis algorithms to map these signatures onto the specification space. Signatures can be efficiently monitored by simple on-chip test instruments that can be integrated together with the system under test. Indirect test is then an interesting path to enable cost-effective BIST for mixed-signal systems. This PICS project has the goal of developing reliable and accurate built-in indirect test methods for complex mixed-signal systems. The project is structured into two interconnected research lines: a) Combining causal inference techniques with feature selection anda feature extraction algotirhms for indirect test, and b) Developing a feature-driven strategy for the definition of on-chip test instruments.