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Author: Gutiérrez Gil, Valentín
Year: Since 2002
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Assessing AMS-RF test quality by defect simulation
V. Gutierrez, A. Gines and G. Leger
Journal Paper - IEEE Transactions on Device and Materials Reliability, vol. 19, no. 1, pp 55-63, 2019
IEEE    DOI: 10.1109/TDMR.2019.2894534    ISSN: 1530-4388    » doi
[abstract]
In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels. However, defect simulation of complex AMS-RF circuits is computationally expensive since achieving good confidence interval requires sampling many defects. In this paper, we show on practical cases of study that it is beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to get a complete picture of test quality. The computational burden of defect and fault simulations is taken into account and accurate statistical estimates of defect and fault escapes are provided to allow safe early stopping of the simulations.

Single Event Transient injection in large mixed-signal circuits
V. Gutierrez and G. Leger
Conference - Conference on Design of Circuits and Integrated Systems DCIS 2018
[abstract]
Abstract not avaliable

AMS-RF test quality: Assessing defect severity
V. Guiterrez, A. Gines and G. Leger
Conference - IEEE Int. Symposium on On-Line Testing and Robust System Design IOLTS 2018
[abstract]
In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels. However, defect simulation of complex AMS-RF circuits is computationally expensive since achieving good confidence interval requires sampling many defects. In this paper, we show on a practical case of study that it may be beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to get a complete picture of test quality.

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