1. Characterization and modeling of TDV effects in advanced CMOS technologies
2. Development of electrical models of beyond-CMOS devices including variability
1. Analysis of the impact of TZV in low-power beyond-CMOS circuits
2. Analysis of the impact of aging on circuit performance and lifetime for low power applications
3. Analysis of impact of RTN
1. Advanced CMOS variability-aware design methodologies
2. Evaluation of variability-aware design techniques in beyond-CMOS circuits
1. Variability exploitation for robust cryptographic primitives
2. Beyond-CMOS devices for improving security in cryptographic circuits