- "A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs" A. Santana-Andreo, P. Saraza-Canflanca, H. Carrasco-Lopez, P. Brox, R. Castro-Lopez, E. Roca and F.V. Fernandez, INTEGRATION, The VLSI Journal, l, vol. 85, pp. 1-9, July 2022. DOI: doi.org/10.1016/j.vlsi.2022.02.008
- "Characterization and analysis of BTI and HCI effects in CMOS current mirrors" A. Santana-Andreo, P. Martin-Lloret, E. Roca, R. Castro-Lopez and F.V. Fernandez, has been accepted as oral presentation at the 2022 edition of the International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), Villasimius, Sardinia, Italy, in June 12-15, 2022.
- "A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation" P. Saraza-Canflanca, J. Martin-Martinez, E. Roca, R. Castro-Lopez, R. Rodriguez, M. Nafria and F.V. Fernandez, has been accepted as oral presentation at the 2022 edition of the International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), Villasimius, Sardinia, Italy, in June 12-15, 2022.
- "High-level design of a novel PUF based on RTN" E. Camacho-Ruiz, R. Castro-Lopez, E. Roca and F.V. Fernandez, has been accepted as oral presentation at the 2022 edition of the International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), Villasimius, Sardinia, Italy, in June 12-15, 2022.
- "On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF" E. Camacho-Ruiz, A. Santana-Andreo, R. Castro-Lopez, E. Roca and F.V. Fernandez, has been accepted as oral presentation at the 2022 edition of the International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), Villasimius, Sardinia, Italy, in June 12-15, 2022.
- "Impact of BTI and HCI on the reliability of a majority voter" A. Santana-Andreo, E. Roca, R. Castro-Lopez and F.V. Fernandez, has been accepted as oral presentation at the 2022 edition of the International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), Villasimius, Sardinia, Italy, in June 12-15, 2022.
- "A novel Physical Unclonable Function using RTN" E. Camacho-Ruiz, R. Castro-Lopez, E. Roca, P. Brox and F.V. Fernandez, has been accepted as oral presentation at the IEEE International Symposium on Circuits and Systems (ISCAS), Austin, TX, USA in May 28-June 1, 2022.
- "Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures" A. Santana-Andreo, P. Martin-Lloret, E. Roca, R. Castro-Lopez, and F.V. Fernandez, has been accepted as oral presentation at the 2022 International Conference on Microelectronic Test Structures (ICMTS). Cleveland, OH, USA in March 21-24, 2022.
- "A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies" P. Saraza-Canflanca, H. Carrasco-Lopez, A. Santana-Andreo, J. Diaz-Fortuny, R. Castro-Lopez, E. Roca, F. V. Fernandez, has been accepted as poster presentation at the 2022 International Reliability Physics Symposium (IRPS), Dallas, Texas, USA in March 27-31, 2022.