Journals
1. A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs
A. Santana-Andreo, P. Saraza-Canflanca, H. Carrasco-Lopez, P. Brox, R. Castro-Lopez, E. Roca and F.V. Fernandez, Integration, The VLSI Journal, vol. 85, pp. 1-9, July 2022.
DOI: doi.org/10.1016/j.vlsi.2022.02.008
2. On the impact of the biasing history on the characterization of Random Telegraph Noise
P. Saraza-Canflanca, R. Castro-Lopez, E. Roca, J. Martin-Martinez, R. Rodriguez, M. Nafria and F.V. Fernandez, IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-10, 2022, Art no. 2003410.
DOI: doi.org/10.1109/TIM.2022.3166195
3. Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs
P. Saraza-Canflanca, R. Castro-Lopez, E. Roca, J. Martin-Martinez, R. Rodriguez, M. Nafria and F.V. Fernandez, IEEE Transactions on Electron Devices, vol. 69, pp. 5424-5429, 2022.
DOI: doi.org/10.1109/TED.2022.3198383
International Conferences
1. A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies
P. Saraza-Canflanca, H. Carrasco-Lopez, A. Santana-Andreo, J. Diaz-Fortuny, R. Castro-Lopez, E. Roca, F. V. Fernandez, Proceedings International Reliability Physics Symposium (IRPS), 2022.
2. Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures
A. Santana-Andreo, P. Martin-Lloret, E. Roca, R. Castro-Lopez, and F.V. Fernandez, Proceedings IEEE International Conference on Microelectronic Test Structures (ICMTS), 2022.
3. A novel Physical Unclonable Function using RTN
E. Camacho-Ruiz, R. Castro-Lopez, E. Roca, P. Brox and F.V. Fernandez, Proceedings IEEE International Symposium on Circuits and Systems (ISCAS), 2022.
4. Machine Learning Approaches for Transformer Modeling
F. Passos, N. Lourenço, R. Martins, E. Roca, R. Castro-Lopez, N. Horta and F.V. Fernandez, Proceedings International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2022.
5. Characterization and analysis of BTI and HCI effects in CMOS current mirrors
A. Santana-Andreo, P. Martin-Lloret, E. Roca, R. Castro-Lopez and F.V. Fernandez, Proceedings International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2022.
6. A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation
P. Saraza-Canflanca, J. Martin-Martinez, E. Roca, R. Castro-Lopez, R. Rodriguez, M. Nafria and F.V. Fernandez, Proceedings International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2022.
7. High-level design of a novel PUF based on RTN
E. Camacho-Ruiz, R. Castro-Lopez, E. Roca and F.V. Fernandez, Proceedings International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2022.
8. On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF
E. Camacho-Ruiz, A. Santana-Andreo, R. Castro-Lopez, E. Roca and F.V. Fernandez, Proceedings International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2022.
9. Impact of BTI and HCI on the reliability of a majority voter
A. Santana-Andreo, E. Roca, R. Castro-Lopez and F.V. Fernandez, Proceedings International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2022.
10. Solving Combinatorial Optimization Problems with Coupled Phase Transition based Oscillators
J. Núñez, M.J. Avedillo and M. Jiménez. Proceedings XXXVII Conference on Design of Circuits and Integrated Systems DCIS 2022.
11. Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications
J. Núñez, S. Thomann, H. Amrouch and M.J. Avedillo. Proceedings IEEE International Conference on Electronics Circuits and Systems ICECS 2022.
12. FeFETs for Phase Encoded Oscillatory based Computing
J. Núñez, M. Jiménez, B. Linares-Barranco and M.J. Avedillo. Proceedings Design, Automation and Test in Europe DATE 2022.