Journals
1. Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging
A. Santana-Andreo, P. Saraza-Canflanca, R. Castro-Lopez, E. Roca and F.V. Fernandez, AEU-International Journal of Electronics and Communications, vol. 176, Art no. 155147, 2024.
DOI: doi.org/10.1016/j.aeue.2024.155147
2. A CMOS-compatible oscillation-based VO2 Ising machine solver
O. Maher, M. Jiménez, C. Delacour, N. Harnack, J. Núñez, M. J. Avedillo, B. Linares-Barranco, A. Todri-Sanial, G. Indiveri and S. Karg, Nature Communications vol. 15, Art. no. 3334, 2024.
DOI: doi.org/10.1038/s41467-024-47642-5
International Conferences