Accelerating electronic wear prediction

IMSE proposes efficient solutions for modeling large-scale circuit degradation

Researchers from the Institute of Microelectronics of Seville (IMSE-CNM), in collaboration with the Technical University of Munich, have published an article examining a phenomenon that affects the reliability of electronic chips. Their components degrade over time, causing circuits to function more slowly or even fail.

Currently, there are highly detailed scientific models that accurately simulate how this problem affects the transistor level (the basic building blocks of chips). But there is a major drawback: these models are so complex that applying them to large circuits would be very difficult because it would take too long to calculate. To solve this problem, the study proposes compressing the information required by these models so that they can be executed quickly and reliably.

In addition to the technical and scientific value of the study, it is worth highlighting its relevance in the context of sustainability. More accurately understanding and predicting the wear and tear of electronic circuits allows for the design of more durable and resilient systems, which directly contributes to the fight against premature obsolescence of electronic equipment. By extending the lifespan of devices, the need for frequent replacements is reduced, resulting in significant savings in natural resources, critical raw materials, and energy associated with manufacturing processes. This efficiency results in a positive environmental impact, making the design of more robust microelectronics an essential pillar for the conservation of the planet and the advancement of more sustainable and responsible electronics.

This information and other details can be found at https://ieeexplore.ieee.org/abstract/document/11015631

From IMSE, we would like to congratulate Andrés Santana, Rafael Castro, Elisenda Roca, and Francisco V. Fernández for this research and congratulate them on its subsequent publication in one of the most prestigious journals in the field of microelectronics.